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期刊名:Journal of nanoscience and nanotechnology

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ISSN:1533-4880

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共收录本刊相关文章索引14899
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
Jae Hwa Seo,Young Jun Yoon,Seongjae Cho et al. Jae Hwa Seo et al.
In this study, we have designed and analyzed the electron-hole bilayer (EHB) tunneling field-effect transistors (TFETs) based on various III-V compound semiconductor materials using two-dimensional (2-D) technology computer-aided design (TC...
Myung-Hyun Baek,Taejin Jang,Min-Woo Kwon et al. Myung-Hyun Baek et al.
In this paper, we proposed and fabricated a polysilicon-based four-terminal synaptic transistor. The device has an asymmetric dual-gate structure. The top gate, which uses a thin SiO₂ layer as the gate dielectric, is the input terminal of ...
Ryoongbin Lee,Kitae Lee,Sihyun Kim et al. Ryoongbin Lee et al.
In this paper, we propose a new type of nonvolatile memory (NVM) device based on a tunnel field-effect transistor (TFETs) with Ferroelectric HfO₂ sidewall. By simply utilizing the ferroelectricity of orthorhombic HfO₂ and conventional sid...
Seongbin Oh,Chul-Heung Kim,Soochang Lee et al. Seongbin Oh et al.
As a synaptic device, TFT-type NOR flash memory cell shows reasonable weight levels (50 levels for long-term potentiation (LTP) and 150 levels for long-term depression (LTD)) and large max/min ratio (═50) for synapse weight. Based on the m...
Soochang Lee,Chul-Heung Kim,Seongbin Oh et al. Soochang Lee et al.
We present a two-layer fully connected neuromorphic system based on a thin-film transistor (TFT)-type NOR flash memory array with multiple postsynaptic (POST) neurons. Unsupervised online learning by spike-timing-dependent plasticity (STDP)...
Gi-Yong Lee,Won-Ju Cho Gi-Yong Lee
In this paper, a post-annealing process that uses microwaves to remove the back-interface thermal damage at the interface between the top silicon layer and the buried oxide layer of a silicon-on-insulator (SOI) device caused during rapid th...
Won Douk Jang,Young Jun Yoon,Min Su Cho et al. Won Douk Jang et al.
The effect of interface traps on InGaAs-based vertical gate-all-around (GAA) tunneling field-effect transistors (TFETs) has been investigated using technology computer-aided design (TCAD) simulation. The interface traps distributed within d...
Hyun-Seok Choi,Won-Ju Cho Hyun-Seok Choi
In this work, we have implemented nonvolatile resistive random access memory (ReRAM) cells consisting of one transistor (1T) and one resistor (1R) configuration by integrating a high-performance InGaZnO (IGZO) thin-film-transistor (TFT) and...
Hyun-Jung Kim,Kyu-Won Jang,Hyun-Seok Kim Hyun-Jung Kim
This study investigated DC characteristics of AlGaN/GaN high electron mobility transistors (HEMTs) considering self-heating effect (SHE) with basic T-gate (BT), drain-side extended T-gate (DSET), and source-bridge FP (SBFP) structures. We a...