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期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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共收录本刊相关文章索引2301条
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
Two-dimensional modelling and characterization of gate-to-drain overlap contribution on the leakage current of a MOSFET, used as a GCD [0.03%]
E. Ciantar; S. Burgniard; R. Jérisian; J. Oualid E. Ciantar; S. Burgniard; R. Jérisian; J. Oualid
Quality and reliability engineering international. 1993;9(4):337-340. DOI:10.1002/qre.4680090417 1993
Reliability issues of offset drain transistors after different modes of electrical stress [0.03%]
C. Papadas; P. Mortini; C. Monsérié; G. Ghibaudo; G. Pananakakis C. Papadas; P. Mortini; C. Monsérié; G. Ghibaudo; G. Pananakakis
Quality and reliability engineering international. 1993;9(4):341-346. DOI:10.1002/qre.4680090418 1993
Reliability simulations of the endurance performance of FLOTOX EEPROM cells using spice [0.03%]
F. Gigon; C. Papadas; G. Ghibaudo; G. Pananakakis; P. Mortini F. Gigon; C. Papadas; G. Ghibaudo; G. Pananakakis; P. Mortini
Quality and reliability engineering international. 1993;9(4):347-352. DOI:10.1002/qre.4680090419 1993
Analysis of MOS SOI transistor degradation [0.03%]
V. Berland; A. Touboul; O. Flament V. Berland; A. Touboul; O. Flament
Quality and reliability engineering international. 1993;9(4):353-357. DOI:10.1002/qre.4680090420 1993
Low frequency noise and reliability analysis of avalanche photodiodes [0.03%]
B. K. Jones; D. A. Kozlowski B. K. Jones; D. A. Kozlowski
Quality and reliability engineering international. 1993;9(4):359-362. DOI:10.1002/qre.4680090421 1993
Degradation behaviour of highly coherent 1-55 μm long-cavity multiple quantum well DFB lasers [0.03%]
Mitsuo Fukuda; Fumiyoshi Kano; Takeshi Kurosaki; Jun-Ichi Yoshida Mitsuo Fukuda; Fumiyoshi Kano; Takeshi Kurosaki; Jun-Ichi Yoshida
Quality and reliability engineering international. 1993;9(4):363-365. DOI:10.1002/qre.4680090422 1993
Failure mechanisms in life-tested hemts [0.03%]
W. T. Anderson; K. A. Christianson; C. Moglestue W. T. Anderson; K. A. Christianson; C. Moglestue
Quality and reliability engineering international. 1993;9(4):367-370. DOI:10.1002/qre.4680090423 1993
Failures of ALGaAs/GaAs HEMTs induced by hot electrons [0.03%]
C. Tedesco; C. Canali; F. Magistrali; A. Paccagnella; E. Zanoni C. Tedesco; C. Canali; F. Magistrali; A. Paccagnella; E. Zanoni
Quality and reliability engineering international. 1993;9(4):371-376. DOI:10.1002/qre.4680090424 1993
Very high temperature test of InP-based laser diodes [0.03%]
Monica Tesauri; Giovanni Chiorboli; Paolo Cova; Fausto Fantini; Fabrizio Magistrali; Danila Sala Monica Tesauri; Giovanni Chiorboli; Paolo Cova; Fausto Fantini; Fabrizio Magistrali; Danila Sala
Quality and reliability engineering international. 1993;9(4):377-382. DOI:10.1002/qre.4680090425 1993
The complementary weibull distribution: Unknown or just forgotten? [0.03%]
Antoni Drapella Antoni Drapella
Quality and reliability engineering international. 1993;9(4):383-385. DOI:10.1002/qre.4680090426 1993