Quality and reliability engineering international. 1993;9(4):377-382. doi: 10.1002/qre.4680090425 Q22.82025

Very high temperature test of InP-based laser diodes

Monica Tesauri; Giovanni Chiorboli; Paolo Cova; Fausto Fantini; Fabrizio Magistrali; Danila Sala

DOI: 10.1002/qre.4680090425

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期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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