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期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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共收录本刊相关文章索引2301条
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
Subsurface burnout mechanisms in gallium arsenide (GAAS) electronic devices [0.03%]
W. T. Anderson; D. V. Morgan; F. A. Buot; A. Christou W. T. Anderson; D. V. Morgan; F. A. Buot; A. Christou
Quality and reliability engineering international. 1988;4(3):255-268. DOI:10.1002/qre.4680040309 1988
Reliability and failure patterns arising from fatigue [0.03%]
A. D. S. Carter A. D. S. Carter
Quality and reliability engineering international. 1988;4(3):269-277. DOI:10.1002/qre.4680040310 1988
The bathtub does not hold water any more [0.03%]
Kam L. Wong Kam L. Wong
Quality and reliability engineering international. 1988;4(3):279-282. DOI:10.1002/qre.4680040311 1988
News Digest [0.03%]
Quality and reliability engineering international. 1988;4(3):283-286. DOI:10.1002/qre.4680040312 1988
Call for Papers [0.03%]
Quality and reliability engineering international. 1988;4(3):287-287. DOI:10.1002/qre.4680040313 1988
International calendar of forthcoming events [0.03%]
Quality and reliability engineering international. 1988;4(3):288-291. DOI:10.1002/qre.4680040314 1988
Courses in quality and reliability [0.03%]
Quality and reliability engineering international. 1988;4(3):291-293. DOI:10.1002/qre.4680040315 1988
Guidelines for fracture-safe and fatigue-reliable design of steel structures, William S. Pellini, the welding institute, Cambridge, 1983 reprinted 1986. number of pages 148. price: U.K. $22.50 (members $18.00); elsewhere $27.00 (A4 size paperback) [0.03%]
A. D. S. Carter A. D. S. Carter
Quality and reliability engineering international. 1988;4(3):294-294. DOI:10.1002/qre.4680040316 1988
Structural reliability analysis and prediction, R. E. Melchers. Ellis Horwood, Chichester. 1987. Distributed by John Wiley & Sons Ltd. Number of pages: 398. Price: $57.50 (Hardback) [0.03%]
A. D. S. Carter A. D. S. Carter
Quality and reliability engineering international. 1988;4(3):294-295. DOI:10.1002/qre.4680040317 1988
Failure mechanisms in semiconductor devices, E. A. Amerasekera and D. S. Campbell. Wiley, Chichester, 1987. Number of pages: 205. Price: $19.95 [0.03%]
Finn Jensen Finn Jensen
Quality and reliability engineering international. 1988;4(3):295-296. DOI:10.1002/qre.4680040318 1988