Quality and reliability engineering international. 1988;4(3):295-296. doi: 10.1002/qre.4680040318 Q22.82025

Failure mechanisms in semiconductor devices, E. A. Amerasekera and D. S. Campbell. Wiley, Chichester, 1987. Number of pages: 205. Price: $19.95

Finn Jensen

DOI: 10.1002/qre.4680040318

摘要

期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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