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期刊名：International journal of rf and microwave computer-aided engineering

缩写：INT J RF MICROW C E

ISSN：1096-4290

e-ISSN：1099-047X

IF/分区：1.0/Q4

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共收录本刊相关文章索引1887条
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
Coplanar-to-rectangular waveguide millimeter-wave transitions manufacturing tolerance analysis using the finite-element method [0.03%]
T. Cavanna; E. Franzese; E. Limiti; G. Pelosi; S. Selleri; A. Suriani T. Cavanna; E. Franzese; E. Limiti; G. Pelosi; S. Selleri; A. Suriani
International journal of rf and microwave computer-aided engineering. 2006;16(2):118-124. DOI:10.1002/mmce.20104 2006
Model order reduction of linear and nonlinear 3D thermal finite-element description of microwave devices for circuit analysis [0.03%]
Raphaël Sommet; Christophe Chang; Raymond Quéré; Philippe Duême Raphaël Sommet; Christophe Chang; Raymond Quéré; Philippe Duême
International journal of rf and microwave computer-aided engineering. 2005;15(5):398-411. DOI:10.1002/mmce.20105 2005
RF and microwave power amplifier design by Andrei Grebennikov, McGraw-Hill, New York [0.03%]
Franco Giannini Franco Giannini
International journal of rf and microwave computer-aided engineering. 2005;15(5):506-507. DOI:10.1002/mmce.20106 2005
Matching network design criteria for wideband high-frequency amplifiers [0.03%]
P. Colantonio; F. Giannini; L. Scucchia P. Colantonio; F. Giannini; L. Scucchia
International journal of rf and microwave computer-aided engineering. 2005;15(5):423-433. DOI:10.1002/mmce.20107 2005
Load-impedance selection for maximized large-signal IMD sweet-spot effects [0.03%]
Nuno Borges Carvalho; José Angel García; Edurne Azpitarte; José Carlos Pedro Nuno Borges Carvalho; José Angel García; Edurne Azpitarte; José Carlos Pedro
International journal of rf and microwave computer-aided engineering. 2005;15(5):434-440. DOI:10.1002/mmce.20108 2005
Accurate modeling of electron device I/V characteristics through a simplified large-signal measurement setup [0.03%]
A. Raffo; A. Santarelli; P. A. Traverso; M. Pagani; G. Vannini; F. Filicori A. Raffo; A. Santarelli; P. A. Traverso; M. Pagani; G. Vannini; F. Filicori
International journal of rf and microwave computer-aided engineering. 2005;15(5):441-452. DOI:10.1002/mmce.20109 2005
A 3-V variable-gain amplifier in Si/SiGe BiCMOS technology for 5-GHz WLAN applications [0.03%]
F. Alimenti; V. Palazzari; L. Roselli; A. Scorzoni F. Alimenti; V. Palazzari; L. Roselli; A. Scorzoni
International journal of rf and microwave computer-aided engineering. 2005;15(5):412-422. DOI:10.1002/mmce.20110 2005
High efficiency and high linearity power amplifier design [0.03%]
Paolo Colantonio; José Angel García; Franco Giannini; Carmen Gómez; Nuno Borges Carvalho; Ernesto Limiti; José Carlos Pedro Paolo Colantonio; José Angel García; Franco Giannini; Carmen Gómez; Nuno Borges Carvalho; Ernesto Limiti; José Carlos Pedro
International journal of rf and microwave computer-aided engineering. 2005;15(5):453-468. DOI:10.1002/mmce.20111 2005
Detecting and avoiding odd-mode parametric oscillations in microwave power amplifiers [0.03%]
A. Anakabe; J.M. Collantes; J. Portilla; S. Mons; A. Mallet A. Anakabe; J.M. Collantes; J. Portilla; S. Mons; A. Mallet
International journal of rf and microwave computer-aided engineering. 2005;15(5):469-478. DOI:10.1002/mmce.20112 2005
Large-signal characterization of microwave power devices [0.03%]
Jean-Pierre Teyssier; Denis Barataud; Christophe Charbonniaud; Fabien De Groote; Markus Mayer; Jean-Michel Nébus; Raymond Quéré Jean-Pierre Teyssier; Denis Barataud; Christophe Charbonniaud; Fabien De Groote; Markus Mayer; Jean-Michel Nébus; Raymond Quéré
International journal of rf and microwave computer-aided engineering. 2005;15(5):479-490. DOI:10.1002/mmce.20113 2005