Processing and interpretation of core-electron XPS spectra of complex plasma-treated polyethylene-based surfaces using a theoretical peak model [0.03%]
基于理论峰模型的等离子体处理聚乙烯基表面核心电子XPS光谱的处理和解析
Marc Bruggeman,Mischa Zelzer,Hanshan Dong et al.
Marc Bruggeman et al.
Interpretation of X-ray photoelectron spectroscopy (XPS) spectra of complex material surfaces, such as those obtained after surface plasma treatment of polymers, is confined by the available references. The limited understanding of the chem...
Deep depth profiling using gas cluster secondary ion mass spectrometry: Micrometer topography development and effects on depth resolution [0.03%]
基于气体聚集体二次离子质谱的深部剖析：微米形貌发展及其对深度分辨率的影响
Shin Muramoto,Dan Graham
Shin Muramoto
Secondary ion mass spectrometry using the argon cluster primary ion beam enables molecular compositional depth profiling of organic thin films with minimal loss of chemical information or changes in sputter rate. However, for depth profiles...
Polymer Surface Analysis: The Leadership and Contributions of David Briggs [0.03%]
聚合物表面分析：David Briggs的领导和贡献
David G Castner,Buddy D Ratner
David G Castner
David Briggs was a surface analysis pioneer. Starting in 1970 and continuing throughout his career, Dave used his expertise, vision and ability to quickly master new surface analysis methods and solve important industrial problems. It certa...
Calculations of electron inelastic mean free paths. XII. Data for 42 inorganic compounds over the 50 eV to 200 keV range with the full Penn algorithm [0.03%]
电子非弹性平均自由程的计算．12．采用完整Penn算法，涵盖42种无机物、50eV到200keV范围的数据
Hiroshi Shinotsuka,Shigeo Tanuma,Cedric J Powell et al.
Hiroshi Shinotsuka et al.
We have calculated inelastic mean free paths (IMFPs) for 42 inorganic compounds (AgBr, AgCl, AgI, Al2O3, AlAs, AlN, AlSb, cubic BN, hexagonal BN, CdS, CdSe, CdTe, GaAs, GaN, GaP, GaSb, GaSe, InAs, InP, InSb, KBr, KCl, MgF2, MgO, NaCl, NbC0....
David G Castner
David G Castner
Surfaces and interfaces play a critical role in material performance in many applications including catalysis, biomaterials, microelectronics, tribology and adhesion. Characterizing the important surfaces and interfaces involved in each app...
Quantitative analysis of trace levels of surface contamination by X-ray photoelectron spectroscopy Part I: statistical uncertainty near the detection limit [0.03%]
X射线光电子能谱法进行表面痕量污染定量分析（一）接近检出限时的统计不确定度分析
Shannon B Hill,Nadir S Faradzhev,Cedric J Powell
Shannon B Hill
We discuss the problem of quantifying common sources of statistical uncertainties for analyses of trace levels of surface contamination using X-ray photoelectron spectroscopy. We examine the propagation of error for peak-area measurements u...
Probing the lipid chemistry of neurotoxin-induced hippocampal lesions using multimodal imaging mass spectrometry [0.03%]
基于多模成像质谱技术探讨神经毒素诱导海马损伤的脂质化学变化规律
Jörg Hanrieder,Oskar Karlsson,Eva Brittebo et al.
Jörg Hanrieder et al.
The environmental toxin β-N-methylamino-L-alanine (BMAA) has been causatively linked to neurodegenerative disease pathology. In a rat model, neonatal BMAA exposure resulted in selective uptake in the hippocampal formation and caused learni...
Calculations of Electron Inelastic Mean Free Paths. XI. Data for Liquid Water for Energies from 50 eV to 30 keV [0.03%]
电子非弹性平均自由程的计算.XI.液态水在50eV到30keV能量范围内数据
H Shinotsuka,B Da,S Tanuma et al.
H Shinotsuka et al.
We calculated electron inelastic mean free paths (IMFPs) for liquid water from its optical energy-loss function (ELF) for electron energies from 50 eV to 30 keV. These calculations were made with the relativistic full Penn algorithm (FPA) t...
Quasi-simultaneous acquisition of nine secondary ions with seven detectors on NanoSIMS50L: application to biological samples [0.03%]
NanoSIMS50L采集器同时测量生物样品中九个二次离子的可行性研究
Christelle Guillermier,Matthew L Steinhauser,Claude P Lechene
Christelle Guillermier
We employed a method of electrostatic peak switching allowing for the quasi-simultaneous measurement of 16O, 18O, C2H, C2D,12C14N, 13C14N, 12C15N, P, and S with the NanoSIMS 50L instrument to derive ratios for D/H, 13C/12C, 18O/16O, and 15N...
Low Temperature Plasma for the Preparation of Crater Walls for Compositional Depth Profiling of Thin Inorganic Multilayers [0.03%]
低温等离子体用于制备薄膜无机多层膜的成分深度剖析凹坑壁的研究
Shin Muramoto,Joe Bennett
Shin Muramoto
An indirect, compositional depth profiling of an inorganic multilayer system using a helium low temperature plasma (LTP) containing 0.2% (v/v) SF6 was evaluated. A model multilayer system consisting of four 10 nm layers of silicon separated...