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期刊名:Microscopy

缩写:MICROSCOPY-JPN

ISSN:2050-5698

e-ISSN:2050-5701

IF/分区:1.8/Q4

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共收录本刊相关文章索引871条
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Asahi Mizuno,Yohei K Sato,Masami Terauchi et al. Asahi Mizuno et al.
β-CuGaO2 has attracted attention as a photovoltaic material because of its p-type semiconducting nature and strong-visible-light absorption capability. Because ion-exchange methods yield only micron-sized crystals and random orientations, ...
Ayumu Oyaizu,Satoko Toyama,Takehito Seki et al. Ayumu Oyaizu et al.
We theoretically investigated how the arrangements of tilt points affect the suppression of diffraction contrast in tilt-scan-averaged differential phase contrast scanning transmission electron microscopy (tDPC STEM). To examine the effecti...
Akemi Kumagai,Hiroshi Jinnai Akemi Kumagai
In situ tensile testing in a transmission electron microscope (TEM) is a powerful tool for investigating polymer fracture at the nanoscale, but the stochastic nature of crack initiation has long hindered systematic observation. We report a ...
Mayu Togashi,Yuki Tanaka,Toshiki Shimizu et al. Mayu Togashi et al.
Polyvinylidene fluoride (PVDF) is a polymer with excellent piezoelectric properties. The close relationship between structure and properties necessitates structural investigation. The PVDF structure has been investigated using techniques su...
Masami Terauchi,Yuki Hada,Yudai Hatakeyama et al. Masami Terauchi et al.
The angle-dependences of N-K emission intensity profile of hBN on polar angle θ and azimuth angle ϕ were examined. The θ-dependent N-K emission intensity profiles show different angle dependences in the top and the bottom region of valen...
Daisuke Unabara,Yohei K Sato,Tasuku Hamaguchi et al. Daisuke Unabara et al.
Cryogenic transmission electron microscopy (cryo-TEM) is a powerful method that enables the observation of nanomaterials while preserving the specimen in a vitrified state, and minimizing damage caused by the electron-beam irradiation. Alth...
Satoko Toyama,Yoshifumi Kojima,Ayumu Oyaizu et al. Satoko Toyama et al.
In-situ biasing differential phase contrast (DPC) scanning transmission electron microscopy (STEM) offers a powerful tool for visualizing local electric fields in devices under operating conditions. However, robust protocols for quantitativ...
Jonathan J P Peters,Grigore Moldovan,Lewys Jones Jonathan J P Peters
Scanning transmission electron microscopy (STEM) has a number of benefits over conventional parallel illumination transmission electron microscopy, such as the ability to simultaneously perform a range of imaging and spectroscopy techniques...
Kousuke Ooe,Takehito Seki,Kaname Yoshida et al. Kousuke Ooe et al.
Observation of beam-sensitive materials in scanning transmission electron microscopy (STEM) requires not only the development of highly dose-efficient imaging techniques but also the selection of appropriate imaging conditions such as the r...
Shin Inamoto,Akiyo Yoshida,Mayumi Oto et al. Shin Inamoto et al.
Focused ion beam (FIB) processing is widely used for preparing transmission electron microscopy (TEM) specimens of polymer materials. However, it often introduces damaged layers that hinder structural analysis. In this study, we demonstrate...