High-resolution spin-polarized scanning tunneling spectroscopy using a functionalized superconducting tip [0.03%]
利用功能化超导针尖的高分辨自旋极化扫描隧道谱学研究
T Machida
T Machida
Detecting spin states of electrons at the atomic scale has been at the heart of progress in condensed matter physics. Spin-polarized scanning tunneling microscopy and spectroscopy (SP-STM/STS) has provided important insights into understand...
Hikaru Saito,Takumi Sannomiya
Hikaru Saito
Controlling electromagnetic modes in nanostructures is vital for developing advanced optical devices. Metal surfaces with periodic structures, so-called plasmonic crystals (PlCs) form band structures of surface plasmon polaritons (SPPs), pr...
Carrier-mediated reduction mechanism in WO3 nanowires under electron-beam irradiation [0.03%]
电子束辐照下WO3纳米线载流子介导的还原机制
Sho Nekita,Itsuki Misono,Kazuhiro Yasuda et al.
Sho Nekita et al.
Electron-beam irradiation often induces unintended structural and chemical changes in materials. Here, we show that damage and reduction in tungsten trioxide (WO3) nanowires are primarily driven by a carrier-mediated ionization process. In ...
Valence electron spectroscopy using soft X-ray emission spectroscopy electron microscopes [0.03%]
基于软X射线发射电子显微镜的价电子谱学研究
Masami Terauchi
Masami Terauchi
Compact soft-X-ray emission spectroscopy (SXES) instrument, which was first applied to transmission electron microscope, was recently applied to scanning electron microscope and electron-probe microanalyzer, which improved the practical app...
Semi-supervised semantic segmentation of SEM images considering multi-scale structural consistency loss in semiconductor pattern layouts [0.03%]
考虑半导体图案布局中多尺度结构一致性的半监督语义分割的扫描电子显微镜图像.semantic segmentation 译为“语义分割”；structural consistency loss 译为“结构一致性损失”。
Akira Ito,Atsushi Miyamoto
Akira Ito
In the fabrication of semiconductor devices, increased yield is achieved using Scanning Electron Microscopes (SEM) to measure and inspect circuit patterns. With recent decreasing scale and increasing complexity of semiconductor circuit patt...
Jun Kikkawa
Jun Kikkawa
This paper provides an overview of phonon measurement using electron energy loss spectroscopy (EELS) in the electron microscope, with polar cubic boron nitride (c-BN) and nonpolar diamond crystals as representative examples. Differential sc...
Development of a Wire Corrector for Low Accelerating Voltage Scanning Electron Microscopy [0.03%]
低加速电压扫描电子显微镜用线性校正器的开发
Tomonori Nakano,Yu Yamazawa
Tomonori Nakano
Aberration correctors are essential for achieving high-resolution imaging in advanced electron microscopy. However, their complexity and cost have limited their integration into conventional scanning electron microscopes (SEMs), particularl...
Manabu Ishimaru
Manabu Ishimaru
The development of radiation tolerant materials is of technological importance for establishing safe operating systems in the nuclear industry, from power generation to the immobilization of high-level radioactive waste. Harsh radiation env...
Sho Nekita,Naomu Sekiguchi,Yuya Kasamura et al.
Sho Nekita et al.
According to theoretical predictions, local strain in the bent regions of flexible nanowires can alter their electronic structure. However, the experimental validation of such strain-induced effects remains elusive. In this study, we establ...
Cathodoluminescence, light injection and EELS in STEM: From comparative to coincidence experiments [0.03%]
阴极发光、光注入和EELS在扫描透射电子显微镜中的应用：从比较实验到同步实验
Luiz H G Tizei,Yves M Auad,Florian Castioni et al.
Luiz H G Tizei et al.
Electron spectroscopy implemented in electron microscopes provides high spatial resolution, down to the atomic scale, of the chemical, electronic, vibrational and optical properties of materials. In this review, we will describe how tempora...