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期刊名:Ultramicroscopy

缩写:ULTRAMICROSCOPY

ISSN:0304-3991

e-ISSN:1879-2723

IF/分区:2.6/Q2

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共收录本刊相关文章索引2941条
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A A Trubitsyn,E Yu Grachev,E G Kochergin A A Trubitsyn
An approach to modeling cathode lenses with arbitrary electrode configurations is developed, in which the electric field on the symmetry axis is calculated using the boundary element method. Criteria for the telescopic mode of idealized and...
A A Trubitsyn,E Yu Grachev,E G Kochergin A A Trubitsyn
An approach to modeling cathode lenses with arbitrary electrode configurations is developed, in which the electric field on the symmetry axis is calculated using the boundary element method. Criteria for the telescopic mode of idealized and...
Yifeng Huang,Xingxu Yan,Toshihiro Aoki et al. Yifeng Huang et al.
Monochromated electron energy loss spectroscopy in advanced scanning transmission electron microscopes has become a powerful tool for probing local electronic and vibrational spectra in many materials. However, acquiring high-quality multi-...
Zac Thollar,Kanto Maeda,Tetsuya Kubota et al. Zac Thollar et al.
Reliable quantitative analysis in scanning (transmission) electron microscopy (S(T)EM) is often hindered by image drift during long-duration spectral mapping for elemental analysis or for various material functions. We here present snapshot...
Cheng-Ying Tsai,Weilun Qin,Jiapeng Li et al. Cheng-Ying Tsai et al.
Femtosecond electron beams serve as effective tools for investigating ultrafast structural and dynamic processes in matter, providing complementary capabilities to femtosecond laser beams. In this paper we propose and demonstrate the feasib...
N Grogger,M Oberaigner,J Lammer et al. N Grogger et al.
The use of large-area and multi-detector energy-dispersive X-ray spectrometer (EDXS) systems introduces a number of complex challenges with regard to the accuracy of EDXS quantification. This is due to the increased absorption effects and v...
Gregory Nordahl,Rebekka Klemmt,Martin Wibrand Larsen et al. Gregory Nordahl et al.
We introduce a denoising method for four-dimensional scanning transmission electron microscopy (4D-STEM) for Bragg diffraction analysis that relies on processing local, scan position-independent electron event-sparse data stacks, called eve...
Xianlin Qu,Ren Xu,Bowen Liu et al. Xianlin Qu et al.
High-resolution imaging and accurate measurement of atomic column positions are essential for achieving an atomistic understanding of crystalline structures. Annular bright-field scanning transmission electron microscopy (ABF-STEM) and inte...
Annett Thøgersen,Georg Muntingh,Lasse Vines et al. Annett Thøgersen et al.
High-resolution band-gap mapping at oxide heterointerfaces is challenged by probe delocalization, overlapping spectral contributions, and the interplay between strain and composition. Here, we combine monochromated, probe-corrected scanning...
Zdeněk Nekula,Jakub Bělín,Andrea Konečná Zdeněk Nekula
Accurate wave-optical simulation in electron microscopy is severely constrained by the extreme sampling requirements imposed by short wavelengths and relatively large convergence angles. Conventional implementations of the angular spectrum ...