Using stretching-modulation-compression effect to generate isolated few-femtosecond MeV electron bunches [0.03%]
利用拉伸-调制-压缩效应产生少于几个飞秒的兆电子伏特电子束簇
Cheng-Ying Tsai,Weilun Qin,Jiapeng Li et al.
Cheng-Ying Tsai et al.
Femtosecond electron beams serve as effective tools for investigating ultrafast structural and dynamic processes in matter, providing complementary capabilities to femtosecond laser beams. In this paper we propose and demonstrate the feasib...
edXTrace: A ray tracing software tool for correcting absorption effects and detector shadowing for EDXS quantification in the TEM [0.03%]
用于校正吸收效应和探测器阴影以进行TEM中EDXS定量的光线追踪软件工具
N Grogger,M Oberaigner,J Lammer et al.
N Grogger et al.
The use of large-area and multi-detector energy-dispersive X-ray spectrometer (EDXS) systems introduces a number of complex challenges with regard to the accuracy of EDXS quantification. This is due to the increased absorption effects and v...
Gregory Nordahl,Rebekka Klemmt,Martin Wibrand Larsen et al.
Gregory Nordahl et al.
We introduce a denoising method for four-dimensional scanning transmission electron microscopy (4D-STEM) for Bragg diffraction analysis that relies on processing local, scan position-independent electron event-sparse data stacks, called eve...
The distinct displacement of atomic column position induced by crystal symmetry effects in ABF-STEM and iDPC-STEM imaging [0.03%]
晶体对称性效应在ABF-STEM和iDPC-STEM成像中引起的原子柱位置偏移现象
Xianlin Qu,Ren Xu,Bowen Liu et al.
Xianlin Qu et al.
High-resolution imaging and accurate measurement of atomic column positions are essential for achieving an atomistic understanding of crystalline structures. Annular bright-field scanning transmission electron microscopy (ABF-STEM) and inte...
Decoupling composition and band gap in κ-Ga2O3 heterostructures via STEM-EELS [0.03%]
基于STEM-EELS的κ-Ga2O3异质结构能带隙和组分解耦研究
Annett Thøgersen,Georg Muntingh,Lasse Vines et al.
Annett Thøgersen et al.
High-resolution band-gap mapping at oxide heterointerfaces is challenged by probe delocalization, overlapping spectral contributions, and the interplay between strain and composition. Here, we combine monochromated, probe-corrected scanning...
Zdeněk Nekula,Jakub Bělín,Andrea Konečná
Zdeněk Nekula
Accurate wave-optical simulation in electron microscopy is severely constrained by the extreme sampling requirements imposed by short wavelengths and relatively large convergence angles. Conventional implementations of the angular spectrum ...
Unsupervised deep image prior for sparse-view and limited-angle electron tomography [0.03%]
用于稀疏视图和受限角度电子层析成像的无监督深度图像先验方法
Serge Brosset,Daniel Del Pozo Bueno,Thomas David et al.
Serge Brosset et al.
Electron tomography (ET) plays an important role in the three-dimensional (3D) characterization of nanomaterials. However, when the angular range is limited (limited-angle tomography) and the tilt increment is large (sparse-view tomography)...
Determination of the structure of the tertiary phase in the alloy Al10Mo10Nb10Ta10Ti30Zr30 using convergent beam electron diffraction [0.03%]
采用汇聚束电子衍射确定合金Al10Mo10Nb10Ta10Ti30Zr30中三元相的结构
P L O&#x;Kelly,J K Jensen,B A Welk et al.
P L O&#x;Kelly et al.
In this study, the determination of the structure of the tertiary phase which forms following heat treatment in an alloy based on Ti-Zr-Mo-Nb-Ta-Al is reported. Positive identification of the structure was accomplished using convergent beam...
Predictive drift compensation of multi-frame STEM via live scan modification [0.03%]
基于实时扫描修正的多帧STEM预测偏移校正方法研究
Matthew Mosse,Jonathan J P Peters,Eoin Moynihan et al.
Matthew Mosse et al.
Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or beam drift, manifesting as distortions within images or movemen...
Deep PACBED: Multitask analysis of PACBED images using deep neural networks [0.03%]
基于深度神经网络的PACBED图像多任务分析（Deep PACBED）
Daniel Schneider,Jonas Scheunert,Damien Heimes et al.
Daniel Schneider et al.
Modern scanning transmission electron microscopes (STEMs) can generate large image datasets of semiconductor samples. The recorded position-averaged convergent beam electron diffraction (PACBED) images are useful for measuring parameters su...