Jonathan D Hollenbach,Stewart A Koppell,Darian Smalley et al.
Jonathan D Hollenbach et al.
Spatiotemporal dose control utilizing custom, vectorized scan trajectories in scanning transmission electron microscopy can be used to reduce image artifacts, mitigate beam-induced damage, minimize electrostatic charging, and enable the pre...
Preparation method for in situ tensile testing in transmission electron microscopy based on push-to-pull chip [0.03%]
Rongshen Huang,Xiao Liu,Yanchen Fan et al.
Rongshen Huang et al.
In the research and development of advanced metallic materials at the micro- and nano-scale, in-situ mechanical characterization plays a critical role in evaluating material mechanical behavior. The Bruker Push-to-Pull (PTP) chip-based in-s...
Kei Nagatomo,Takeshi Otsuka,Yuhei Nakajima et al.
Kei Nagatomo et al.
Surface roughness plays a crucial role in determining the physical and functional properties of materials, particularly in electroplated coatings for semiconductor and manufacturing applications. In this study, we investigate the feasibilit...
About the alignment and 3D reconstruction of sparse cryo-scanning transmission electron tomography datasets [0.03%]
关于稀疏冷冻扫描透射电子层析数据的校准和三维重建
Sylvain Trépout
Sylvain Trépout
In electron microscopy, sparse imaging consists in the collection of a limited subset of the image pixels, which can be used to reduce electron beam damage. Scanning transmission electron microscopy (STEM) is particularly adapted to sparse ...
Design and simulation of ellipsoidal single-bounce mono-capillary condensers for a laboratory X-Ray nano-imaging system [0.03%]
实验室X射线纳米成像系统的椭球单反射单波导冷凝器的设计与模拟研究
Qi Zhong,Yu Han,Xiaoqi Xi et al.
Qi Zhong et al.
X-ray nano-imaging enables nondestructive characterization at the nanoscale. However, limited by factors such as source brightness, divergence angle, and focal spot size, the development of laboratory X-ray nano-imaging systems still faces ...
Meishan Li,Hongqing Tao,Hangfeng Hu et al.
Meishan Li et al.
To achieve higher performance of energy analyzers or mass spectrometers, the design of their core components, i.e., the magnetic sector analyzers, requires the analysis of the third-order aberrations. In this work, the successive approximat...
A calculation approach for the virtual source spatial distribution of sub-beams in single-emitter multi-electron-beam systems [0.03%]
单电子发射器多电子束系统子光斑虚拟源空间分布的计算方法研究
Jintao Hu,Yihao Ma,Lei Yue et al.
Jintao Hu et al.
In this paper, an approach is proposed for computing the spatial distribution characteristics (i.e., positions and sizes) of virtual sources of sub-beams in a single-emitter multi-electron beam system (MEBS). First, the electron trajectorie...
Influence of total electron dose on the quality of nucleic acids potential maps in Cryo-EM [0.03%]
总电子剂量对Cryo-EM核酸质量图的影响
Grzegorz Ważny,Marcin Jaciuk,Paulina Indyka et al.
Grzegorz Ważny et al.
The standardization of protocols in science lies at the basis of every experiment. During this process, some crucial questions need to be answered. The quality of results in single particle cryo-Electron Microscopy (cryo-EM) requires optimi...
Lau Morten Kaas,Raquel Aymerich-Armengol,Daan Hein Alsem et al.
Lau Morten Kaas et al.
Transmission electron microscopy has become a valuable tool for time-resolved characterization of nano-scale materials during exposure to liquid environments. As the imaging resolution and contrast depends on liquid thickness, measurements ...
Desheng Ma,Guanxing Li,David A Muller et al.
Desheng Ma et al.
Contrast transfer mechanisms for electron scattering have been extensively studied in transmission electron microscopy. Here we revisit H. Rose's generalized contrast formalism from scattering theory to understand where information is encod...