SEM-EDAX: A tool for microanalytical elemental mapping in butterfly wing scales [0.03%]
SEM-EDAX：一种蝴蝶翅膀鳞片微区分析的工具
Amina Thaj,Gopal Prasad
Amina Thaj
Scanning Electron Microscopy (SEM) integrated with Energy-Dispersive X-ray Analysis (EDAX) provides an effective approach for investigating the elemental composition of butterfly wing scales at the microscale. Microanalytical studies of but...
Cryo-SEM documentation of intact frozen-fractured avian eggs reveals species-dependent albumen freezing morphologies [0.03%]
cryo-sem观察到的完整冻结断裂禽蛋揭示了依赖物种的蛋白冷冻形态
Wen-Hsin Chung,Kung-Ming Lai,Kuo-Chiang Hsu
Wen-Hsin Chung
Cryo-scanning electron microscopy (cryo-SEM) was used to examine intact frozen-fractured eggs from five avian species-quail, hen, duck, turkey, and goose-spanning two taxonomic orders (Galliformes and Anseriformes) and a wide range of egg s...
Touching the cell without contact: a comprehensive review of scanning ion conductance microscopy methodologies for advanced subcellular mechanical imaging [0.03%]
无接触触碰细胞：扫描离子导纳显微技术在亚细胞机械成像应用的全面综述
T O Sovetnikov,A D Terentev,A I Akhmetova et al.
T O Sovetnikov et al.
Scanning ion conductance microscopy (SICM) is a unique technique that enables non-contact, high-resolution, multiparametric imaging of living cells under physiological conditions. Recent advances have extended the capabilities of SICM to qu...
Momentum transfer broadening in Compton electron energy loss spectroscopy [0.03%]
康普顿电子能量损失光谱中的动量转移展宽现象
R Armah-Kwantreng,B G Mendis
R Armah-Kwantreng
Electron Compton scattering is a momentum resolved, electron energy loss spectroscopy (EELS) technique for measuring Jpz, the electron momentum density for the solid projected along the scattering vector direction. For accurate Jpz there sh...
Atomic-scale TEM characterization of dislocation-precipitate interaction mechanisms in a cold-worked Al-Cu-Mg-Si alloy [0.03%]
冷变形Al-Cu-Mg-Si合金中位错-析出相交互作用机制的原子尺度TEM表征
Vu Ngoc Hai,Abrar Ahmed,Seungwon Lee et al.
Vu Ngoc Hai et al.
This study examines dislocation structures and their interactions with nanoscale precipitates in an Al-Cu-Mg-Si alloy using transmission electron microscopy (TEM) and high-angle annular dark-field scanning TEM (HAADF-STEM). The alloy was su...
Special issue: Quantitative and precise measurements in conventional (scanning) electron microscopy and electron tomography [0.03%]
常规(扫描)电子显微镜和电子层析成像中的定量和精确测量特别专题
Marek Malac,Ken Harada,Toshie Yaguchi et al.
Marek Malac et al.
A general framework for vectorial detection PSF analysis for oblique plane microscopy utilizing trans-medium intermediate image coupling [0.03%]
一种通用框架的向量检测点扩散函数分析斜面显微镜中利用介物平面耦合图像技术
Jiapeng Zhu,Haoliang Luo,Hanxiao Chen et al.
Jiapeng Zhu et al.
We present a unified theoretical framework for vectorial detection point spread function (PSF) analysis in oblique plane microscopy (OPM) systems incorporating arbitrary combinations of secondary and tertiary objectives. By modeling the amp...
A multiscale attention network for mixed artifact suppression in AFM images [0.03%]
一种用于AFM图像混合伪影抑制的多尺度注意力网络
Mingzhen Bu,Yanyan Wang,Junlong Huang et al.
Mingzhen Bu et al.
Accurate nanoscale characterization with Atomic Force Microscopy (AFM) is frequently hindered by complex mixed noise, particularly directional line artifacts and stochastic scars that stem from the instrument's electromechanical noise and f...
Correlative microscopy across standalone systems for investigation of crystal growth and nanoscale morphology in PLA [0.03%]
跨独立系统的相关显微镜在聚乳酸晶体生长和纳米级形貌研究中的应用
Matthias Balthasar Kesting,Tekie Ogbazghi,Jörg Meyer et al.
Matthias Balthasar Kesting et al.
A workflow for multimodal characterization across individual microscopy systems is shown. This is of high importance because different microscopy methods complement each other and provide complementarily data regarding contrast and resoluti...
Revisiting crystalline orientation relationship measurements via electron diffraction - enhancing efficiency and accuracy through post‑processing [0.03%]
基于电子衍射的晶体取向关系测定及后处理优化效率和精度研究
Hongwei Liu
Hongwei Liu
Crystalline orientation relationships (OR) between adjacent grains or phases are essential for characterize grain boundaries and interfaces in structural and functional crystalline materials. Although electron-diffraction -based methods for...