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期刊名：Ieee transactions on reliability

缩写：IEEE T RELIAB

ISSN：0018-9529

e-ISSN：1558-1721

IF/分区：5.7/Q1

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共收录本刊相关文章索引5965条
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
Failure rate of a cold- or hot-spared component with a lognormal lifetime [0.03%]
Joyce, W.B.; Anthony, P.J. Joyce
Ieee transactions on reliability. 1988;37(3):299-307. DOI:10.1109/24.3759 1988
Survey of reliability studies of consecutive-k-out-of-n:F and related systems [0.03%]
Chao, M.T.; Fu, J.C.; Koutras et al. Chao et al.
Ieee transactions on reliability. 1995;44(1):120-127. DOI:10.1109/24.376531 1995
An O(k3·log(n/k)) algorithm for the consecutive-k-out-of-n:F system [0.03%]
Hwang, F.K.; Wright, P.E. Hwang
Ieee transactions on reliability. 1995;44(1):128-131. DOI:10.1109/24.376533 1995
Stochastic modeling of aggregates and products of variable failure rates [0.03%]
Singh, N. Singh
Ieee transactions on reliability. 1995;44(2):279-284. DOI:10.1109/24.391346 1995
Popcorning: a failure mechanism in plastic-encapsulated microcircuits [0.03%]
Gallo, A.A.; Munamarty, R. Gallo
Ieee transactions on reliability. 1995;44(3):362-367. DOI:10.1109/24.406565 1995
Joint reliability-importance of components [0.03%]
Armstrong, M.J. Armstrong
Ieee transactions on reliability. 1995;44(3):408-412. DOI:10.1109/24.406574 1995
Evaluating processor-behavior and three error-detection mechanisms using physical fault-injection [0.03%]
Miremadi, G.; Torin, J. Miremadi
Ieee transactions on reliability. 1995;44(3):441-454. DOI:10.1109/24.406580 1995
Amdahl's law: a generalization under processor failures [0.03%]
Onyuksel, I.; Hosseini, S.H. Onyuksel
Ieee transactions on reliability. 1995;44(3):455-462. DOI:10.1109/24.406581 1995
The failure rate of software: does it exist? [0.03%]
Singpurwalla, N.D. Singpurwalla
Ieee transactions on reliability. 1995;44(3):463-469. DOI:10.1109/24.406582 1995
Interval estimation from a life-test through a sequential Kolmogorov-Smirnov type procedure [0.03%]
Gastaldi, T. Gastaldi
Ieee transactions on reliability. 1995;44(3):470-476. DOI:10.1109/24.406587 1995