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期刊名：Ieee transactions on reliability

缩写：IEEE T RELIAB

ISSN：0018-9529

e-ISSN：1558-1721

IF/分区：5.7/Q1

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共收录本刊相关文章索引5965条
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
A new estimation approach based on periodic inspection [0.03%]
Dattero, R.; White, E.M. Dattero
Ieee transactions on reliability. 1989;38(4):436-439. DOI:10.1109/24.46458 1989
Relayed communication via parallel redundancy [0.03%]
Chrysaphinou, O.; Papastavridis, S.; Sypsas et al. Chrysaphinou et al.
Ieee transactions on reliability. 1989;38(4):454-456. DOI:10.1109/24.46462 1989
Optimal relayed mobile communication systems [0.03%]
Hwang, F.K.; Shi, D. Hwang
Ieee transactions on reliability. 1989;38(4):457-459. DOI:10.1109/24.46463 1989
Lifetime distribution of circular consecutive-k-out-of-n:F systems with exchangeable lifetimes [0.03%]
Papastavridis, S.G. Papastavridis
Ieee transactions on reliability. 1989;38(4):460-461. DOI:10.1109/24.46464 1989
Optimal replacement policies for k-out-of-n systems [0.03%]
Chung, C.-S.; Flynn, J. Chung
Ieee transactions on reliability. 1989;38(4):462-467. DOI:10.1109/24.46465 1989
Multistate consecutively-connected systems [0.03%]
Hwang, F.K.; Yao, Y.C. Hwang
Ieee transactions on reliability. 1989;38(4):472-474. DOI:10.1109/24.46467 1989
Effects of redundancy management on reliability modeling [0.03%]
Walker, B.K.; Wereley, N.M.; Luppold et al. Walker et al.
Ieee transactions on reliability. 1989;38(4):475-482. DOI:10.1109/24.46468 1989
A practical end-of-life model for semiconductor devices [0.03%]
Ash, M.S.; Gorton, H.C. Ash
Ieee transactions on reliability. 1989;38(4):485-493. DOI:10.1109/24.46470 1989
Reliability of directed networks using the factoring theorem [0.03%]
Page, L.B.; Perry, J.E. Page
Ieee transactions on reliability. 1989;38(5):556-562. DOI:10.1109/24.46479 1989
Comments on "A method to predict an average activation energy for subassemblies" [with reply] [0.03%]
Moura, E.C.; Fieselman, C.D.; Seager et al. Moura et al.
Ieee transactions on reliability. 1989;38(5):563-564. DOI:10.1109/24.46480 1989