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期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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共收录本刊相关文章索引2301条
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
Systems of experimental design, Genichi Taguchi (editor for english edition, Don Clausing). Unib Kraus international pub & American supplier institute. number of pages (two volumes): 1192. price: $150 (U.S.A.); $93 (U.K.) [0.03%]
L. N. Harris L. N. Harris
Quality and reliability engineering international. 1988;4(2):198-199. DOI:10.1002/qre.4680040217 1988
News digest [0.03%]
Quality and reliability engineering international. 1988;4(2):200-201. DOI:10.1002/qre.4680040218 1988
International calendar of forthcoming events [0.03%]
Quality and reliability engineering international. 1988;4(2):202-205. DOI:10.1002/qre.4680040219 1988
Masthead [0.03%]
Quality and reliability engineering international. 1988;4(3):0-0. DOI:10.1002/qre.4680040301 1988
Editorial [0.03%]
KAM L. WON KAM L. WON
Quality and reliability engineering international. 1988;4(3):207-207. DOI:10.1002/qre.4680040302 1988
Short communication environmental stressing for quality and reliability engineers [0.03%]
Wayne Tustin Wayne Tustin
Quality and reliability engineering international. 1988;4(3):209-213. DOI:10.1002/qre.4680040303 1988
The effect of pretinning on the strength of a chip carrier solder joint [0.03%]
Susanne Ohlsson Susanne Ohlsson
Quality and reliability engineering international. 1988;4(3):215-221. DOI:10.1002/qre.4680040304 1988
Load-strength simulation of plastic mouldings [0.03%]
Valter Loll Valter Loll
Quality and reliability engineering international. 1988;4(3):223-226. DOI:10.1002/qre.4680040305 1988
Interval reliability of spare part stocks [0.03%]
Igor Bazovsky; Glen Benz Igor Bazovsky; Glen Benz
Quality and reliability engineering international. 1988;4(3):235-246. DOI:10.1002/qre.4680040307 1988
Death by a thousand cuts: The physics of device failure through a series of activated, microscopic events [0.03%]
A. J. Holden; R. W. Allen; K. Beasley; D. R. Parker A. J. Holden; R. W. Allen; K. Beasley; D. R. Parker
Quality and reliability engineering international. 1988;4(3):247-254. DOI:10.1002/qre.4680040308 1988