Quality and reliability engineering international. 1988;4(3):247-254. doi: 10.1002/qre.4680040308 Q22.82025

Death by a thousand cuts: The physics of device failure through a series of activated, microscopic events

A. J. Holden; R. W. Allen; K. Beasley; D. R. Parker

DOI: 10.1002/qre.4680040308

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期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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