Quality and reliability engineering international文章索引

期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

共收录本刊相关文章索引2301条

Quality, Productivity and Competitive Position, W. Edwards Deming, Massachusetts Institute of Technology. Center for Advanced Engineering Study, 1982. No. of pages: 373 [0.03%]

P.D.T.O' CONNOR P.D.T.O' CONNOR

Quality and reliability engineering international. 1986;2(4):274-274. DOI:10.1002/qre.4680020421 1986

Integrated Product Testing and Evaluation (Revized edn), HAROLD L. GILMORE and HERBERT C. SCHWARTZ. Marcel Dekker, 1986. No. of pages: 376. Price $49.50 (US and Canada): $59.50 (elsewhere) [0.03%]

P.D.T.O' CONNOR P.D.T.O' CONNOR

Quality and reliability engineering international. 1986;2(4):275-275. DOI:10.1002/qre.4680020422 1986

Backdrive of Fast ICs, Elektronik Centralen, Venlighedsvej 4, DK-2970. Hørsholm, Denmark, April 1986 [0.03%]

F. Jensen F. Jensen

Quality and reliability engineering international. 1986;2(4):275-275. DOI:10.1002/qre.4680020423 1986

Masthead [0.03%]

Quality and reliability engineering international. 1987;3(1):0-0. DOI:10.1002/qre.4680030101 1987

Uncertainty! Uncertainty! [0.03%]

KAM.L. WONG. KAM.L. WONG.

Quality and reliability engineering international. 1987;3(1):1-2. DOI:10.1002/qre.4680030102 1987

Integrated circuits for submarine communication systems, their design and development [0.03%]

A. J. Tew A. J. Tew

Quality and reliability engineering international. 1987;3(1):3-13. DOI:10.1002/qre.4680030103 1987

Using statistical control charts for software quality control [0.03%]

John S. Gardiner; Douglas C. Montgomery John S. Gardiner; Douglas C. Montgomery

Quality and reliability engineering international. 1987;3(1):15-20. DOI:10.1002/qre.4680030104 1987

Functional screens for electronic reliability [0.03%]

William A. Ganter William A. Ganter

Quality and reliability engineering international. 1987;3(1):21-23. DOI:10.1002/qre.4680030105 1987

(LCCs) R & M Implications of leadless chip carriers [0.03%]

H. E. Fox H. E. Fox

Quality and reliability engineering international. 1987;3(1):25-32. DOI:10.1002/qre.4680030106 1987

Research into the use of statistical quality control in british manufacturing industry-part II [0.03%]

Roy F. Followell; John S. Oakland Roy F. Followell; John S. Oakland

Quality and reliability engineering international. 1987;3(1):33-39. DOI:10.1002/qre.4680030107 1987