Hsiu-Wen Chen; Hongquan Xu; Weng Kee Wong
Hsiu-Wen Chen; Hongquan Xu; Weng Kee Wong
Statistical Inference on Constant Stress Accelerated Life Tests under Generalized Gamma Lifetime Distributions [0.03%]
Tsai-Hung Fan; Chia-Hsiang Yu
Tsai-Hung Fan; Chia-Hsiang Yu
Jaeheon Lee; Ning Wang; Liaosa Xu; Anna Schuh; William H. Woodall
Jaeheon Lee; Ning Wang; Liaosa Xu; Anna Schuh; William H. Woodall
Nasir Abbas; Muhammad Riaz; Ronald J. M. M. Does
Nasir Abbas; Muhammad Riaz; Ronald J. M. M. Does
Adiel Teixeira de Almeida
Adiel Teixeira de Almeida
Wandi Huang; Sai Wang; Marion R. Reynolds Jr.
Wandi Huang; Sai Wang; Marion R. Reynolds Jr.
Şebnem Yılmaz; Nimetullah Burnak
Şebnem Yılmaz; Nimetullah Burnak
Rui Jiang; Michael Jong Kim; Viliam Makis
Rui Jiang; Michael Jong Kim; Viliam Makis
Raymond R. Hill; Alex J. Gutman; Stephen P. Chambal; Jerry W. Kitchen
Raymond R. Hill; Alex J. Gutman; Stephen P. Chambal; Jerry W. Kitchen
Reliability Modeling for Ultrathin Gate Oxides Subject to Logistic Degradation Processes with Random Onset Time [0.03%]
Hao Peng; Qianmei Feng
Hao Peng; Qianmei Feng