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Quality and reliability engineering international. 2012;aop(aop):-. doi: 10.1002/qre.1419 Q22.82025

Acquisition and Testing, DT/OT Testing: The Need for Two-Parameter Requirements

Raymond R. Hill; Alex J. Gutman; Stephen P. Chambal; Jerry W. Kitchen

DOI: 10.1002/qre.1419

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期刊名:Quality and reliability engineering international

缩写:QUAL RELIAB ENG INT

ISSN:0748-8017

e-ISSN:1099-1638

IF/分区:2.8/Q2

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Acquisition and Testing, DT/OT Testing: The Need for Two-Parameter Requirements