Transfer doublet and an elaborated phase plate holder for 120 kV electron-phase microscope [0.03%]
用于120kV电子相位显微镜的传输双极子和改进型相位板固定架
Fumio Hosokawa,Radostin Danev,Yoshihiro Arai et al.
Fumio Hosokawa et al.
A Zernike-type phase plate, which consisted of an amorphous carbon film, was developed for a 120 kV transmission electron microscope (TEM). The thickness of the film causes the scattered electrons to experience a pi/2 phase shift. The axial...
Reference sample for the evaluation of SEM image resolution at a high magnification--nanometer-scale Au particles on an HOPG substrate [0.03%]
用于高倍数SEM图像分辨率评价的纳米金参考样品——石墨上单分散Au纳米颗粒标样
Shigeo Okayama,Satoshi Haraichi,Hirofumi Matsuhata
Shigeo Okayama
A new sample preparation technique is proposed for evaluating image resolution in a high magnification range of SEM. The proposed reference samples are uniformly distributed nanometer-scale Au particles on HOPG substrate. The samples are fa...
Effects of different fixation and freeze substitution methods on the ultrastructural preservation of ZYMV-infected Cucurbita pepo (L.) leaves [0.03%]
不同的固定和冷冻置换方法对ZYMV感染的Cucurbita pepo(L。)叶片超微结构保存的影响
Bernd Zechmann,Maria Müller,Günther Zellnig
Bernd Zechmann
Different fixation protocols [chemical fixation, plunge and high pressure freezing (HPF)] were used to study the effects of Zucchini yellow mosaic virus (ZYMV) disease on the ultrastructure of adult leaves of Styrian oil pumpkin plants (Cuc...
2D-mapping of dopant distribution in deep sub micron CMOS devices by electron holography using adapted FIB-preparation [0.03%]
采用改进Focused Ion Beam(FIB)制备技术的电子全息法对深次微米互补金属氧化物半导体器件中掺杂分布进行二维成像映射研究
Andreas Lenk,Hannes Lichte,Uwe Muehle
Andreas Lenk
Transmission electron microscopy (TEM) is a widely used tool for analysis of very large scale integrated (VLSI) semiconductor devices. As a special TEM-feature, off-axis electron holography obtains information about the electrical character...
The top-bottom effect of a tilted thick specimen and its influence on electron tomography [0.03%]
倾斜厚样品的上下部效应及其对电子层析的影响
Chao Yang,Hai-Bo Zhang,Jing-Jing Li et al.
Chao Yang et al.
We present the top-bottom effect (TBE) of a 5 microm thick amorphous specimen in a 3 MV ultrahigh voltage electron microscope (ultra-HVEM) and its influence on the quality of electron tomography (ET). The 40-nm gold particles on the top sur...
A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM [0.03%]
一种可有效降低球差校正HRTEM像非线性衬度的简单方法
Jun Yamasaki,Tomoyuki Kawai,Nobuo Tanaka
Jun Yamasaki
A simple and practical method for minimizing non-linear image contrast in spherical aberration-corrected (C(S)-corrected) high-resolution transmission electron microscopy is presented. The effectiveness of the method is considered from the ...
Zuzanna Liliental-Weber,Dmitri N Zakharov,Kin M Yu et al.
Zuzanna Liliental-Weber et al.
Transmission Electron Microscopy (TEM) and X-ray diffraction (XRD) have been used to study compositional modulation in In(x)Ga(1-x) N layers grown with compositions close to miscibility gap. The samples (0.34 < x < 0.8) were deposited by mo...
Electron atomic scattering factors, Debye-Waller factors and the optical potential for high-energy electron diffraction [0.03%]
高能电子衍射条件下的原子散射因子、德拜-瓦勒因子和光学势
Lian-Mao Peng
Lian-Mao Peng
High-energy electrons may be elastically and inelastically scattered by a solid. To a good approximation the effect of inelastic scattering on the elastically scattered electrons may be taken into account using the concept of the complex op...
Phase measurement of atomic resolution image using transport of intensity equation [0.03%]
基于强度传输的原子分辨率像相位测量方法研究
Kazuo Ishizuka,Brendan Allman
Kazuo Ishizuka
Since the Transport Intensity Equation (TIE) has been applied to electron microscopy only recently, there are controversial discussions in the literature regarding the theoretical concepts underlying the equation and the practical technique...
Micro-CT of Pseudocneorhinus bifasciatus by projection X-ray microscopy [0.03%]
投影X射线显微镜下的拟环蛇属 bifasciatus 的微型CT
Akira Tanisako,Ayumi Hori,Aya Okumura et al.
Akira Tanisako et al.
The projection X-ray microscope utilises a very small X-ray source emitted from a thin (0.1-3 microm) target metal film excited by the focused electron beam of a scanning electron microscope. When an object is placed just below the target m...