N G Orji,M Badaroglu,B M Barnes et al.
N G Orji et al.
The semiconductor industry continues to produce ever smaller devices that are ever more complex in shape and contain ever more types of materials. The ultimate sizes and functionality of these new devices will be affected by fundamental and...
Distortion-free measurement of electric field strength with a MEMS sensor [0.03%]
基于MEMS传感器的无畸变电场强度测量方法研究
Andreas Kainz,Harald Steiner,Johannes Schalko et al.
Andreas Kainz et al.
Small-scale and distortion-free measurement of electric fields is crucial for applications such as surveying atmospheric electrostatic fields, lightning research, and safeguarding areas close to high-voltage power lines. A variety of measur...