Omkar A Nafday,Jason R Haaheim,Fredy Villagran
Omkar A Nafday
The ability to deposit different materials with nanoscale precision at user-specified locations is a very important attribute of dip pen nanolithography (DPN). However, the potential of DPN goes beyond simple deposition since DPN used in co...
Synthesis of cobalt oxide aerogels and nanocomposite systems containing single-walled carbon nanotubes [0.03%]
钴氧化物气凝胶及含单壁碳纳米管的纳米复合体系的制备
Simerjeet K Gill,Andrew M Shobe,Louisa J Hope-Weeks
Simerjeet K Gill
The synthesis and characterization of porous nanostructured cobalt oxide (Co3O4) aerogels using epoxide addition method is described. Cobalt-containing monoliths were obtained by sol-gel processing of an alcoholic cobalt chloride solution w...
Confocal microscopy reveals Myzitiras and Vthela morphotypes as new signatures of malignancy progression [0.03%]
共聚焦显微镜揭示了Myzitiras和Vthela形态型是恶性肿瘤进展的新标志
Pavel Veselý,Daniel Rösel,Daniela Panková et al.
Pavel Veselý et al.
G3S1 cells are a new line derived from EM-G3 breast cancer cells by chronic nutritional stress and treatments with 12-O-tetradecanoylphorbol-13-acetate. These cells are capable of growing in standard medium. G3S1 cells exhibited elevated in...
Investigations on the leaf surface ultrastructure in grapevine (Vitis vinifera L.) by scanning microscopy [0.03%]
扫描电子显微镜观察葡萄叶片表面超微结构的研究
A Bensalem-Fnayou,N Jellouli,B Bouamama et al.
A Bensalem-Fnayou et al.
Several Scanning microscopy techniques were used to investigate the leaf surface ultrastructure in the local "Razegui" grapevine cultivar (Vitis vinifera L.). Conventional scanning electron microscopy performed on glutaraldehyde-fixed sampl...
The effects of space charge on contrast in images obtained using the environmental scanning electron microscope [0.03%]
空间电荷对环境扫描电子显微镜图像对比度的影响
M Toth,MR Phillips
M Toth
We present experimental evidence for the existence of a space charge in the environmental scanning electron microscope. Space charge formation is attributed to differences in the mobilities of negative and positive charge carriers in the im...
Polymer-based materials to be used as the active element in microsensors: a scanning force microscopy study [0.03%]
基于聚合物的微传感器活性元器件材料：扫描力显微镜研究
TL Porter,MP Eastman,DL Pace et al.
TL Porter et al.
Polymer-based materials can be incorporated as the active sensing elements in chemiresistor devices. Most of these devices take advantage of the fact that certain polymers will swell when exposed to gaseous analytes. To measure this respons...
M Micic,M Jeremic,K Radotic et al.
M Micic et al.
In this paper we are presenting the results of our environmental scanning electron microscopy (ESEM) investigation of the lignin model compound--enzymatically polymerized coniferyl alcohol, also known as dehydrogenate polymer (DHP). The goa...
Inexpensive, high-quality optical relay for use in confocal scanning beam imaging [0.03%]
低成本高光学继电器在共聚焦扫描束成像中的应用
AC Ribes,S Damaskinos,AE Dixon
AC Ribes
An inexpensive, high optical-quality relay lens made up of two eyepieces arranged in an afocal assembly for use in confocal scanning laser imaging is described. In the past we have used relays, within our confocal microscopes, made up of ac...
High-resolution scanning electron microscopy study of sputtered nanolaminated Ti/TiN multilayers [0.03%]
溅射纳米叠层Ti/TiN多层膜的高分辨率扫描电子显微分析研究
Le Paven-Thivet C,C Sant,F Grillon et al.
Le Paven-Thivet C et al.
This work presents the morphologic and structural study of nanolaminated Ti/TiN multilayers using high-resolution scanning electron microscopy (HR-SEM), coupled to x-ray reflectometry (XRR). The multilayers have been deposited by reactive r...
Charge contrast imaging of material growth and defects in environmental scanning electron miscroscopy--linking electron emission and cathodoluminescence [0.03%]
环境扫描电子显微镜中的材料生长和缺陷的电荷对比成像——连接电子发射和阴极发光
BJ Griffin
BJ Griffin
An electron-based technique for the imaging of crystal defect distribution such as material growth histories in non- and poorly conductive materials has been identified in the variable pressure or environmental scanning electron microscope....