Journal of materials science-materials in electronics文章索引

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期刊名：Journal of materials science-materials in electronics

缩写：J MATER SCI-MATER EL

ISSN：0957-4522

e-ISSN：1573-482X

IF/分区：3.2/Q2

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共收录本刊相关文章索引3980条

GeSe2–Ga2S3–PbI2as materials for IR-stimulated optical second harmonic generation [0.03%]

Jean Ebothe; W. Imiolek; K. J. Plucinski; D. Hui Jean Ebothe; W. Imiolek; K. J. Plucinski; D. Hui

Journal of materials science-materials in electronics. 2008;19(3):233-236. DOI:10.1007/s10854-007-9268-7 2008

Activation kinetics of the As acceptor in HgCdTe [0.03%]

D. Shaw; P. Capper D. Shaw; P. Capper

Journal of materials science-materials in electronics. 2008;19(1):67-73. DOI:10.1007/s10854-007-9269-6 2008

Influence of deposition parameters on preferred orientation of RF magnetron sputtered BST thin films [0.03%]

Songzhan Li; Yanqin Yang; L. Liu; T. J. Zhang; W. H. Huang Songzhan Li; Yanqin Yang; L. Liu; T. J. Zhang; W. H. Huang

Journal of materials science-materials in electronics. 2008;19(3):223-226. DOI:10.1007/s10854-007-9270-0 2008

Phase relations in the Cu2Te–Al2Te3semiconductor system [0.03%]

B. V. Korzun; A. A. Fadzeyeva; K. Bente; Th. Doering B. V. Korzun; A. A. Fadzeyeva; K. Bente; Th. Doering

Journal of materials science-materials in electronics. 2008;19(3):255-260. DOI:10.1007/s10854-007-9271-z 2008

Effect of temperature on thermally induced defects in silicon [0.03%]

Akbar Ali; Abdul Majid; M. Nawaz Saleh Akbar Ali; Abdul Majid; M. Nawaz Saleh

Journal of materials science-materials in electronics. 2008;19(3):267-269. DOI:10.1007/s10854-007-9272-y 2008

Effect of LP-buffer on the structure of ZnO thin films prepared on glass substrate using RF magnetron sputtering [0.03%]

Zhu Xingwen; Li Yingwei; Li Yongqiang; Ma Ji; Xia Yiben Zhu Xingwen; Li Yingwei; Li Yongqiang; Ma Ji; Xia Yiben

Journal of materials science-materials in electronics. 2007;18(10):1021-1025. DOI:10.1007/s10854-007-9273-x 2007

Synthesis and optical characterization of ZnO and ZnO:Al nanocrystalline films obtained by the sol-gel dip-coating process [0.03%]

C. D. Bojorge; H. R. Cánepa; U. E. Gilabert; D. Silva; E. A. Dalchiele; R. E. Marotti C. D. Bojorge; H. R. Cánepa; U. E. Gilabert; D. Silva; E. A. Dalchiele; R. E. Marotti

Journal of materials science-materials in electronics. 2007;18(11):1119-1125. DOI:10.1007/s10854-007-9274-9 2007

A new binderless thick-film piezoelectric paste [0.03%]

Darryl P. J. Cotton; Paul H. Chappell; Andy Cranny; Neil M. White Darryl P. J. Cotton; Paul H. Chappell; Andy Cranny; Neil M. White

Journal of materials science-materials in electronics. 2007;18(10):1037-1044. DOI:10.1007/s10854-007-9275-8 2007

Conductance analysis of (Co, Nb, Fe)-doped SnO2thick film gas sensors [0.03%]

Miguel Adolfo Ponce; Rodrigo Parra; Miriam S. Castro; Celso M. Aldao Miguel Adolfo Ponce; Rodrigo Parra; Miriam S. Castro; Celso M. Aldao

Journal of materials science-materials in electronics. 2007;18(12):1171-1177. DOI:10.1007/s10854-007-9276-7 2007

Effect of Mn doping on the structural, morphological, optical and magnetic properties of indium tin oxide films [0.03%]

K. M. Reddy; J. Hays; S. Kundu; L. K. Dua; P. K. Biswas; C. Wang; V. Shutthanandan; M. H. Engelhard; X. Mathew; A. Punnoose K. M. Reddy; J. Hays; S. Kundu; L. K. Dua; P. K. Biswas; C. Wang; V. Shutthanandan; M. H. Engelhard; X. Mathew; A. Punnoose

Journal of materials science-materials in electronics. 2007;18(12):1197-1201. DOI:10.1007/s10854-007-9277-6 2007