Chetan S. Shukla; F. Frank Chen
Chetan S. Shukla; F. Frank Chen
Scott L. Springer; Rajit Gadh
Scott L. Springer; Rajit Gadh
Pierre Lefrançois; Steve Harvey; Benoit Montreuil; Bacem Moussa
Pierre Lefrançois; Steve Harvey; Benoit Montreuil; Bacem Moussa
An application-independent methodology of feature recognition with explicit representation of feature interaction [0.03%]
Ramesh V. Narang
Ramesh V. Narang
é. Dupinet; M. Balazinski; E. Czogala
é. Dupinet; M. Balazinski; E. Czogala
Constraint network approach to the design and manufacture of labels in a high-variety label-printing environment [0.03%]
A. O. Awofala; N. Singh
A. O. Awofala; N. Singh
Teruaki Ito; Shuichi Fukuda
Teruaki Ito; Shuichi Fukuda
Issam M. Kouatli
Issam M. Kouatli
Bin Wu; Jonathan J. M. Seddon
Bin Wu; Jonathan J. M. Seddon
P. Banerjee; S. Y. Nof
P. Banerjee; S. Y. Nof