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期刊名：Ieee transactions on reliability

缩写：IEEE T RELIAB

ISSN：0018-9529

e-ISSN：1558-1721

IF/分区：5.7/Q1

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共收录本刊相关文章索引5965条
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
Correction [to "System operational readiness and equipnlent dependability"] [0.03%]
Ieee transactions on reliability. 1966;R-15(3):119-119. DOI:10.1109/tr.1966.5217615 1966
Point and Interval Estimation, From One-Order Statistic, of the Location Parameter of an Extreme-Value Distribution with Known Scale Parameter and of the Scale Parameter of a Weibull Distribution with Known Shape Parameter [0.03%]
Moore, Albert H.; Harter, H. Leon Moore
Ieee transactions on reliability. 1966;R-15(3):120-126. DOI:10.1109/tr.1966.5217616 1966
The Analysis of a Class of Non-Series Parallel Redundant Systems [0.03%]
Benning, Carl J. Benning
Ieee transactions on reliability. 1966;R-15(3):127-132. DOI:10.1109/tr.1966.5217617 1966
Comments on "System operational readiness and equipment dependability'' [0.03%]
Einhorn, Sheldon J. Einhorn
Ieee transactions on reliability. 1966;R-15(3):132-132. DOI:10.1109/tr.1966.5217618 1966
Availability of the Standardized Weibull Distribution [0.03%]
Schafer, Raymond E. Schafer
Ieee transactions on reliability. 1966;R-15(3):132-133. DOI:10.1109/tr.1966.5217619 1966
Contributors [0.03%]
Ieee transactions on reliability. 1966;R-15(3):133-134. DOI:10.1109/tr.1966.5217620 1966
Editor's Note [0.03%]
Ieee transactions on reliability. 1966;R-15(3):134-134. DOI:10.1109/tr.1966.5217621 1966
Information for authors [0.03%]
Ieee transactions on reliability. 1966;R-15(3):0-0. DOI:10.1109/tr.1966.5217622 1966
Opening Comments [0.03%]
Cunningham, Clair E. Cunningham
Ieee transactions on reliability. 1967;R-16(1):3-4. DOI:10.1109/tr.1967.5217444 1967
Breaker Page [0.03%]
Ieee transactions on reliability. 1968;R-17(3):0-0. DOI:10.1109/tr.1968.5216923 1968