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期刊名:Journal of nanoscience and nanotechnology

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ISSN:1533-4880

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IF/分区:0.0/

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共收录本刊相关文章索引14899
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
Youn-Jea Kim,Jong-Chul Lee Youn-Jea Kim
Pure sulfur hexafluoride (SF6) is chemically inert, non-flammable, non-toxic and thermally stable, and it has excellent dielectric strength and arc-quenching and control properties. The switching-off process of SF6 arc discharges occurs at ...
Seongbin Kim,Sinsu Kyoung Seongbin Kim
In order to protect the gate oxide from electrostatic discharge (ESD) in power MOSFET, the on-chip ESD protection circuits are required. Zener diode on poly silicon gate was normally used in power device because Zener diode structure was ea...
Sungmin Hwang,Hyungjin Kim,Min-Woo Kwon et al. Sungmin Hwang et al.
In this study, we proposed an online learning method using spike-timing dependent plasticity (STDP) whose operation is analogous to gradient descent, the most successful learning algorithm for nonspiking artificial neural networks (ANNs). W...
Juhyun Kim,Myunggon Kang,Jongwook Jeon et al. Juhyun Kim et al.
In this paper, lateral gate-all-around nano-plate transistors (NP-FETs) for 3.5 nm technology node were optimized and compared with other nodes such as 7 nm and 5 nm node devices. The transistors' electrostatic was analyzed using a 3D TCAD ...
Kyungchul Park,Min-Woo Kwon,Myung-Hyun Baek et al. Kyungchul Park et al.
In this paper, we investigated the dependence of minority carrier lifetime on dual gate FBFET. Generally, depending on the channel condition or trap density, the lifetime of minority carrier can be degraded. Since the potential barrier lowe...
Bo Gyeong Kim,Jae Hwa Seo,Young Jun Yoon et al. Bo Gyeong Kim et al.
In this work, an InGaAs/GaAsSb-based P-type gate-all-around (GAA) arch-shaped tunneling fieldeffect transistor (TFET) was designed and analyzed using technology computer-aided design (TCAD) simulations. The device performance was investigat...
Min Su Cho,Young Jun Yoon,Bo Gyeong Kim et al. Min Su Cho et al.
This paper report a junctionless fin-type field-effect-transistor based capacitorless dynamic random access memory using three-dimensional technology computer-aided design simulations. The proposed 1T-DRAM is made up of a silicon germanium ...
Ju Chan Lee,Tae Jun Ahn,Yun Seop Yu Ju Chan Lee
A Si/Ge hetero tunnel field-effect transistor (TFET) with junctionless channel based on nanowire (JLNW-TFET) is proposed, and its electrical performance and dependency of natural parameters are investigated. The JLNW-TFET is operated by com...
Taejin Jang,Myung-Hyun Baek,Min-Woo Kwon et al. Taejin Jang et al.
In this paper, we analyze hot carrier injection (HCI) in an asymmetric dual gate structure with a charge storage layer. In a floating gate device, holes injected by HCI can move freely in the valence band, since the channel potential is con...
Cheol Kim,Sung-Gi Ahn,Jisu Min et al. Cheol Kim et al.
This paper proposes a nonvolatile-based Ternary Content Addressable Memory (nvTCAM) with efficient dynamic power. The selective search line technique reduces the unnecessary power consumption by designating the search range according to the...