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期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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共收录本刊相关文章索引2301条
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
Erratum [0.03%]
Quality and reliability engineering international. 1990;6(2):0-0. DOI:10.1002/qre.4680060202 1990
Editorial [0.03%]
Henry A. Malec Henry A. Malec
Quality and reliability engineering international. 1990;6(2):71-71. DOI:10.1002/qre.4680060203 1990
Reliability critical thermal model for double-drift IMPATT diodes on diamond heat sinks [0.03%]
G. Csanky G. Csanky
Quality and reliability engineering international. 1990;6(2):73-84. DOI:10.1002/qre.4680060204 1990
Relay failure prevention by internal visual inspection [0.03%]
J. Mejerovich; M. Brenman J. Mejerovich; M. Brenman
Quality and reliability engineering international. 1990;6(2):85-92. DOI:10.1002/qre.4680060205 1990
Accelerated life-test experiments on low-power rectifier diodes [0.03%]
Joachim Windel Joachim Windel
Quality and reliability engineering international. 1990;6(2):93-105. DOI:10.1002/qre.4680060206 1990
The dynamic histogram chart [0.03%]
Donald S. Holmes; A. Erhan Mergen Donald S. Holmes; A. Erhan Mergen
Quality and reliability engineering international. 1990;6(2):107-111. DOI:10.1002/qre.4680060207 1990
The design of mechanical equipment for the limitation of in-service failure [0.03%]
P. Martin P. Martin
Quality and reliability engineering international. 1990;6(2):113-119. DOI:10.1002/qre.4680060208 1990
The use of taguchi methods in performance demonstrations [0.03%]
G. R. Bandurek; H. L. Hughes; D. Crouch G. R. Bandurek; H. L. Hughes; D. Crouch
Quality and reliability engineering international. 1990;6(2):121-131. DOI:10.1002/qre.4680060209 1990
Variation of defect density and its influence on yield extrapolation for integrated circuits [0.03%]
W. G. Kleppmann; R.-P. Vollertsen W. G. Kleppmann; R.-P. Vollertsen
Quality and reliability engineering international. 1990;6(2):133-143. DOI:10.1002/qre.4680060210 1990
Improved alignment of fibre-optics active devices via response surface methodology [0.03%]
Eric Tan; T. N. Goh Eric Tan; T. N. Goh
Quality and reliability engineering international. 1990;6(2):145-151. DOI:10.1002/qre.4680060211 1990