首页 文献索引 SCI期刊 AI助手
期刊目录筛选

期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

文章目录 更多期刊信息

共收录本刊相关文章索引2301条
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
In-process quality control for manufacturing, W. E. Barkman, Marcel Dekker, 1989. number of pages: 278. price: $99.75 (North America); $119.50 (elsewhere) [0.03%]
P. D. T. O'connor P. D. T. O'connor
Quality and reliability engineering international. 1989;5(4):339-339. DOI:10.1002/qre.4680050417 1989
Masthead [0.03%]
Quality and reliability engineering international. 1990;6(1):0-0. DOI:10.1002/qre.4680060101 1990
Editorial [0.03%]
Quality and reliability engineering international. 1990;6(1):1-1. DOI:10.1002/qre.4680060102 1990
Message from the Editor [0.03%]
Quality and reliability engineering international. 1990;6(1):3-3. DOI:10.1002/qre.4680060103 1990
Letter to the Editor [0.03%]
Quality and reliability engineering international. 1990;6(1):5-6. DOI:10.1002/qre.4680060104 1990
Some problems encountered in the construction and interpretation of control charts [0.03%]
B. G. Dale; P. Shaw B. G. Dale; P. Shaw
Quality and reliability engineering international. 1990;6(1):7-12. DOI:10.1002/qre.4680060105 1990
A theoretical approach to a transformer reliability problem [0.03%]
J. R. Pollock; P. W. Hale J. R. Pollock; P. W. Hale
Quality and reliability engineering international. 1990;6(1):13-18. DOI:10.1002/qre.4680060106 1990
Measuring process capability using indices — some new considerations [0.03%]
Leslie J. Porter; John S. Oakland Leslie J. Porter; John S. Oakland
Quality and reliability engineering international. 1990;6(1):19-27. DOI:10.1002/qre.4680060107 1990
Metal–GaAs interaction and contact degradation in microwave MESFETs [0.03%]
Enrico Zanoni; Alessandro Callegari; Claudio Canali; Fausto Fantini; Hans L. Hartnagel; Fabrizio Magistrali; Alessandro Paccagnella; Massimo Vanzi Enrico Zanoni; Alessandro Callegari; Claudio Canali; Fausto Fantini; Hans L. Hartnagel; Fabrizio Magistrali; Alessandro Paccagnella; Massimo Vanzi
Quality and reliability engineering international. 1990;6(1):29-46. DOI:10.1002/qre.4680060108 1990
DoD microcircuit qualification innovation–QML [0.03%]
Edward B. Hakim Edward B. Hakim
Quality and reliability engineering international. 1990;6(1):47-50. DOI:10.1002/qre.4680060109 1990