George Box; Søren Bisgaard; Conrad Fung
George Box; Søren Bisgaard; Conrad Fung
Kailash C. Kapur; Guangming Chen
Kailash C. Kapur; Guangming Chen
Dorian Shainin; Peter Shainin
Dorian Shainin; Peter Shainin
Jae Song; John Lawson
Jae Song; John Lawson
N. Logothetis; A. Haigh
N. Logothetis; A. Haigh
G. R. Bandurek; J. Disney; A. Bendell
G. R. Bandurek; J. Disney; A. Bendell
Worst case product performance verification with electromagnetic interference test applications [0.03%]
Forrest W. Breyfogle; Jim H. Davis
Forrest W. Breyfogle; Jim H. Davis
Wenhao Wang; John Lawson
Wenhao Wang; John Lawson