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期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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共收录本刊相关文章索引2301条
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
Masthead [0.03%]
Quality and reliability engineering international. 1986;2(4):0-0. DOI:10.1002/qre.4680020401 1986
WHO NEEDS Q & R STANDARDS? [0.03%]
P.D.T.O' CONNOR P.D.T.O' CONNOR
Quality and reliability engineering international. 1986;2(4):219-220. DOI:10.1002/qre.4680020402 1986
Economic models and process quality control [0.03%]
Douglas C. Montgomery; Robert H. Storer Douglas C. Montgomery; Robert H. Storer
Quality and reliability engineering international. 1986;2(4):221-228. DOI:10.1002/qre.4680020403 1986
Surface mount digital package reliability [0.03%]
William J. Roesch William J. Roesch
Quality and reliability engineering international. 1986;2(4):229-232. DOI:10.1002/qre.4680020404 1986
Simplified markov techniques for some stand-by redundant systems [0.03%]
R. Hamilton; I. ; Bazovsky Sr R. Hamilton; I. ; Bazovsky Sr
Quality and reliability engineering international. 1986;2(4):233-240. DOI:10.1002/qre.4680020405 1986
Goodness of fit of small samples to the weibull distribution [0.03%]
R. D. Leitch R. D. Leitch
Quality and reliability engineering international. 1986;2(4):241-246. DOI:10.1002/qre.4680020406 1986
FAILURE ANALYSIS ON BIPOLAR INTEGRATED CIRCUITS ATTRIBUTES DAMAGE TO ELECTROSTATIC DISCHARGE [0.03%]
G. N. Wills G. N. Wills
Quality and reliability engineering international. 1986;2(4):247-254. DOI:10.1002/qre.4680020407 1986
Semiconductor device burn-in, is there a future? [0.03%]
Ron Parsons Ron Parsons
Quality and reliability engineering international. 1986;2(4):255-258. DOI:10.1002/qre.4680020408 1986
Acceleration and time to fail [0.03%]
P. W. Hale P. W. Hale
Quality and reliability engineering international. 1986;2(4):259-262. DOI:10.1002/qre.4680020409 1986
Reliability of a dynamic random access memory (dram) [0.03%]
P. W. Hale P. W. Hale
Quality and reliability engineering international. 1986;2(4):263-266. DOI:10.1002/qre.4680020410 1986