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期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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共收录本刊相关文章索引2301条
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
Selection and use of engineering materials, F. A. A. Crane and J. A. Charles, Butterworths, Sevenoaks, 1984. No. of pages: 303 [0.03%]
Roger Allen Roger Allen
Quality and reliability engineering international. 1985;1(2):139-139. DOI:10.1002/qre.4680010217 1985
Three new books on quality circles [0.03%]
P. D. T. O'Connor P. D. T. O'Connor
Quality and reliability engineering international. 1985;1(2):140-140. DOI:10.1002/qre.4680010218 1985
Repairable systems reliability: Modelling, inference, misconceptions and their causes, harold ascher and harry feingold, marcel dekker inc., 1984 [0.03%]
Norman Harris Norman Harris
Quality and reliability engineering international. 1985;1(2):140-141. DOI:10.1002/qre.4680010219 1985
Reliability evaluation of power systems, Roy Billington and Ronald N. Allan, Plenum Press, New York and London, 1984 [0.03%]
Torben L. Laubst Torben L. Laubst
Quality and reliability engineering international. 1985;1(2):141-141. DOI:10.1002/qre.4680010220 1985
Independent Test Houses [0.03%]
Quality and reliability engineering international. 1985;1(2):142-143. DOI:10.1002/qre.4680010221 1985
Analysis or synthesis [0.03%]
Kam L. Wong Kam L. Wong
Quality and reliability engineering international. 1985;1(3):144-144. DOI:10.1002/qre.4680010302 1985
A message to quality and reliability professionals [0.03%]
D. A. Stuart D. A. Stuart
Quality and reliability engineering international. 1985;1(3):145-146. DOI:10.1002/qre.4680010303 1985
Reliability in communications satellites [0.03%]
Vincent J. Mancino; Walter J. Slusark Vincent J. Mancino; Walter J. Slusark
Quality and reliability engineering international. 1985;1(3):147-159. DOI:10.1002/qre.4680010304 1985
Estimation of weibull reliability from few life tests [0.03%]
Pasquale Erto; Maurizio Guida Pasquale Erto; Maurizio Guida
Quality and reliability engineering international. 1985;1(3):161-164. DOI:10.1002/qre.4680010305 1985
A failure analysis methodology for revealing esd damage to integrated circuits [0.03%]
R. G. Taylor; J. Woodhouse; P. R. Feasey R. G. Taylor; J. Woodhouse; P. R. Feasey
Quality and reliability engineering international. 1985;1(3):165-171. DOI:10.1002/qre.4680010306 1985