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期刊名：Quality and reliability engineering international

缩写：QUAL RELIAB ENG INT

ISSN：0748-8017

e-ISSN：1099-1638

IF/分区：2.8/Q2

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共收录本刊相关文章索引2301条
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
Maintenance planning. Methods and mathematics, P. Lyonnet, Chapman & Hall, 1991. Number of pages: 224 [0.03%]
Antoni Drapella Antoni Drapella
Quality and reliability engineering international. 1993;9(5):467-467. DOI:10.1002/qre.4680090514 1993
Continuous bivariate distributions emphasising applications, T. P. Hutchinson and C. D. Lai, Rumbsby Scientific Publishing, Adelaide, South Australia, 1990. No. of pages 311 + 1648 references + index [0.03%]
Poul Thyregod Poul Thyregod
Quality and reliability engineering international. 1993;9(5):467-467. DOI:10.1002/qre.4680090515 1993
Quality assurance in process plant projects, Derek Maidment and Fred Owen (Eds), Institution of Chemical Engineers, 1993. Number of pages: 50. Price: £29.60 [0.03%]
P. D. T. O'Connor P. D. T. O'Connor
Quality and reliability engineering international. 1993;9(5):468-468. DOI:10.1002/qre.4680090516 1993
Masthead [0.03%]
Quality and reliability engineering international. 1993;9(6):0-0. DOI:10.1002/qre.4680090601 1993
Reliability prediction revisited [0.03%]
P. D. T. O'Connor P. D. T. O'Connor
Quality and reliability engineering international. 1993;9(6):469-470. DOI:10.1002/qre.4680090602 1993
On parameter design of binary-input-and-binary-output dynamic systems [0.03%]
Bong-Jin Yum; Seong-Jun Kim Bong-Jin Yum; Seong-Jun Kim
Quality and reliability engineering international. 1993;9(6):471-476. DOI:10.1002/qre.4680090603 1993
Localization and characterization of latch-up sensitive areas using a laser beam: Influence on design rules of ICs in CMOS technology [0.03%]
P. Fouillat; Y. Danto; J. P. Dom P. Fouillat; Y. Danto; J. P. Dom
Quality and reliability engineering international. 1993;9(6):477-482. DOI:10.1002/qre.4680090604 1993
Reliability testing of polyimides for GaAs MMIC applications [0.03%]
R. F. B. Conlon; J. A. Turner R. F. B. Conlon; J. A. Turner
Quality and reliability engineering international. 1993;9(6):483-487. DOI:10.1002/qre.4680090605 1993
A comparison of deterministic and statistical sampling techniques for quality analysis of integrated circuits [0.03%]
A. A. Ilumoka A. A. Ilumoka
Quality and reliability engineering international. 1993;9(6):489-499. DOI:10.1002/qre.4680090606 1993
Comparative study of quantitative models for hardware, software and human reliability assessment [0.03%]
Lars Bodsberg Lars Bodsberg
Quality and reliability engineering international. 1993;9(6):501-518. DOI:10.1002/qre.4680090607 1993