Guest editorial [0.03%]
Eikichi Yamashita; Masami Akaike
Eikichi Yamashita; Masami Akaike
Moriyasu Miyazaki; Osami Ishida; Tsutomu Hashimoto
Moriyasu Miyazaki; Osami Ishida; Tsutomu Hashimoto
Masayuki Nakajima; Eikichi Yamashita
Masayuki Nakajima; Eikichi Yamashita
A new method for the measurement and analysis of noise parameters for MESFETS and HEMTs (invited article) [0.03%]
Masao Nishida; Hisanori Uda; Yasoo Harada
Masao Nishida; Hisanori Uda; Yasoo Harada
Computer-aided engineering for microwave and millimeter-wave circuits using the FD-TD technique of field simulations (invited article) [0.03%]
Tsugumichi Shibata; Hideaki Kimura
Tsugumichi Shibata; Hideaki Kimura
Cylindrical gate approach for signal and noise modeling of striped channel field-effect transistors (invited article) [0.03%]
Yuji Ando; Masaaki Kuzuhara; Tomohiro Itoh
Yuji Ando; Masaaki Kuzuhara; Tomohiro Itoh