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期刊名:Microelectronic engineering

缩写:MICROELECTRON ENG

ISSN:0167-9317

e-ISSN:1873-5568

IF/分区:3.1/Q2

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共收录本刊相关文章索引21
Clinical Trial Case Reports Meta-Analysis RCT Review Systematic Review
Classical Article Case Reports Clinical Study Clinical Trial Clinical Trial Protocol Comment Comparative Study Editorial Guideline Letter Meta-Analysis Multicenter Study Observational Study Randomized Controlled Trial Review Systematic Review
C Henkel,S Abermann,O Bethge et al. C Henkel et al.
Schottky barrier SOI-MOSFETs incorporating a La(2)O(3)/ZrO(2) high-k dielectric stack deposited by atomic layer deposition are investigated. As the La precursor tris(N,N'-diisopropylformamidinato) lanthanum is used. As a mid-gap metal gate ...