首页 正文

Nondestructive Testing and Evaluation. 2005;20(2):89-102. doi: 10.1080/10589750500149149 Q14.32025

Understanding and predicting electronic vibration stress using ultrasound excitation, thermal profiling, and neural network modeling

利用超声波激励、热分布分析与神经网络建模,实现电子振动应力的解析与预测

Hsieh, Sheng-Jen; Crane, Robert; Sathish, Shamachary

DOI: 10.1080/10589750500149149

摘要

Copyright © Nondestructive Testing and Evaluation. 中文内容为AI机器翻译,仅供参考!

期刊名:Nondestructive testing and evaluation

缩写:NONDESTRUCT TEST EVA

ISSN:1058-9759

e-ISSN:1477-2671

IF/分区:4.3/Q1

文章目录 更多期刊信息

全文链接
引文链接
复制
已复制!
推荐内容
Understanding and predicting electronic vibration stress using ultrasound excitation, thermal profiling, and neural network modeling