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Chinese Physics Letters. 2014;31(3):037201-. doi: 10.1088/0256-307X/31/3/037201 Q14.22025

AlGaN/GaN HEMTs on 4-Inch Silicon Substrates in the Presence of 2.7-μm-Thick Epilayers with the Maximum Off-State Breakdown Voltage of 500 V

在2.7微米厚外延层的4英寸硅衬底上制备的AlGaN/GaN高电子迁移率晶体管,其最大关态击穿电压为500伏。

Yu, Xin-Xin; Ni, Jin-Yu; Li, Zhong-Hui; Kong, Cen; Zhou, Jian-Jun; Dong, Xun; Pan, Lei; Kong, Yue-Chan; Chen, Tang-Sheng

DOI: 10.1088/0256-307X/31/3/037201

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Copyright © Chinese Physics Letters. 中文内容为AI机器翻译,仅供参考!

期刊名:Chinese physics letters

缩写:CHINESE PHYS LETT

ISSN:0256-307X

e-ISSN:1741-3540

IF/分区:4.2/Q1

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AlGaN/GaN HEMTs on 4-Inch Silicon Substrates in the Presence of 2.7-μm-Thick Epilayers with the Maximum Off-State Breakdown Voltage of 500 V