IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2014;22(4):824-837. doi: 10.1109/TVLSI.2013.2256437 Q23.22025

Diagnose Failures Caused by Multiple Locations at a Time

同时诊断由多个位置引起的故障

DOI: 10.1109/TVLSI.2013.2256437

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