IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2009;17(7):953-963. doi: 10.1109/TVLSI.2009.2017441 Q23.22025

On the Exploitation of Narrow-Width Values for Improving Register File Reliability

关于利用窄位宽值提高寄存器文件可靠性的研究

DOI: 10.1109/TVLSI.2009.2017441

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