IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2014;22(4):792-802. doi: 10.1109/TVLSI.2013.2256438 Q23.22025

Test Compaction by Sharing of Transparent-Scan Sequences Among Logic Blocks

通过在逻辑块之间共享透明扫描序列进行测试压缩

DOI: 10.1109/TVLSI.2013.2256438

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