IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2014;22(2):220-231. doi: 10.1109/TVLSI.2013.2243926 Q23.22025

Multivoltage Aware Resistive Open Fault Model

多电压感知电阻开路故障模型

DOI: 10.1109/TVLSI.2013.2243926

摘要 查看摘要

Copyright © IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 中文内容为AI机器翻译，仅供参考！