IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2014;22(1):146-154. doi: 10.1109/TVLSI.2012.2232320 Q23.22025
Extraction of VLSI Multiconductor Transmission Line Parameters by Complementarity
DOI: 10.1109/TVLSI.2012.2232320
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IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2014;22(1):146-154. doi: 10.1109/TVLSI.2012.2232320 Q23.22025
DOI: 10.1109/TVLSI.2012.2232320
摘要 查看摘要