IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2012;20(3):424-436. doi: 10.1109/TVLSI.2011.2106169 Q23.22025

Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays

DOI: 10.1109/TVLSI.2011.2106169

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