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IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2014;22(3):696-700. doi: 10.1109/TVLSI.2013.2249542 Q23.22025

Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization

基于粒子群优化的多故障仿真驱动的多故障诊断框架

Kundu, Subhadip; Jha, Aniket; Chattopadhyay, Santanu; Sengupta, Indranil; Kapur, Rohit

DOI: 10.1109/TVLSI.2013.2249542

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Copyright © IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 中文内容为AI机器翻译,仅供参考!

期刊名:Ieee transactions on very large scale integration (vlsi) systems

缩写:IEEE T VLSI SYST

ISSN:1063-8210

e-ISSN:1557-9999

IF/分区:3.2/Q2

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Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization