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Journal of Intelligent Manufacturing. 2014;25(6):1235-1243. doi: 10.1007/s10845-012-0725-7 Q17.42025

Automatic inspection system of LED chip using two-stages back-propagation neural network

Kuo, Chung-Feng Jeffrey; Hsu, Chien-Tung Max; Liu, Zong-Xian; Wu, Han-Cheng

DOI: 10.1007/s10845-012-0725-7

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Copyright © Journal of Intelligent Manufacturing. 中文内容为AI机器翻译,仅供参考!

期刊名:Journal of intelligent manufacturing

缩写:J INTELL MANUF

ISSN:0956-5515

e-ISSN:1572-8145

IF/分区:7.4/Q1

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Automatic inspection system of LED chip using two-stages back-propagation neural network