Journal of Intelligent Manufacturing. 2014;25(6):1235-1243. doi: 10.1007/s10845-012-0725-7 Q17.42025
Automatic inspection system of LED chip using two-stages back-propagation neural network
DOI: 10.1007/s10845-012-0725-7
摘要 查看摘要
Journal of Intelligent Manufacturing. 2014;25(6):1235-1243. doi: 10.1007/s10845-012-0725-7 Q17.42025
DOI: 10.1007/s10845-012-0725-7
摘要 查看摘要