IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2006;14(6):646-649. doi: 10.1109/TVLSI.2006.878226 Q23.22025

A process variation compensating technique with an on-die leakage current sensor for nanometer scale dynamic circuits

一种带片上漏电流传感器的工艺变异补偿技术，适用于纳米级动态电路

DOI: 10.1109/TVLSI.2006.878226

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