IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2013;21(8):1558-1562. doi: 10.1109/TVLSI.2012.2212254 Q23.22025

Technique for Efficient Evaluation of SRAM Timing Failure

SRAM时序故障的高效评估技术

DOI: 10.1109/TVLSI.2012.2212254

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