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IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2014;22(1):27-38. doi: 10.1109/TVLSI.2012.2236113 Q23.22025

Stability Estimation of a 6T-SRAM Cell Using a Nonlinear Regression

基于非线性回归的6T-SRAM单元稳定性估算

Park, Henry; Yang, Chih-Kong Ken

DOI: 10.1109/TVLSI.2012.2236113

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Copyright © IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 中文内容为AI机器翻译,仅供参考!

期刊名:Ieee transactions on very large scale integration (vlsi) systems

缩写:IEEE T VLSI SYST

ISSN:1063-8210

e-ISSN:1557-9999

IF/分区:3.2/Q2

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Stability Estimation of a 6T-SRAM Cell Using a Nonlinear Regression