IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2013;21(10):1903-1914. doi: 10.1109/TVLSI.2012.2226762 Q23.22025

Mitigating the Impact of Process Variation on the Performance of 3-D Integrated Circuits

DOI: 10.1109/TVLSI.2012.2226762

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