首页 正文

IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2014;22(2):256-269. doi: 10.1109/TVLSI.2013.2239318 Q23.22025

Reliability-Oriented Placement and Routing Algorithm for SRAM-Based FPGAs

Huang, Keheng; Hu, Yu; Li, Xiaowei

DOI: 10.1109/TVLSI.2013.2239318

摘要 查看摘要

Copyright © IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 中文内容为AI机器翻译,仅供参考!

期刊名:Ieee transactions on very large scale integration (vlsi) systems

缩写:IEEE T VLSI SYST

ISSN:1063-8210

e-ISSN:1557-9999

IF/分区:3.2/Q2

文章目录 更多期刊信息

全文链接
引文链接
复制
已复制!
推荐内容
Reliability-Oriented Placement and Routing Algorithm for SRAM-Based FPGAs