IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2009;17(6):781-792. doi: 10.1109/TVLSI.2008.2006795 Q23.22025

Circuit-Level Design Approaches for Radiation-Hard Digital Electronics

抗辐射数字电子电路级设计方法

DOI: 10.1109/TVLSI.2008.2006795

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