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IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2012;20(7):1221-1234. doi: 10.1109/TVLSI.2011.2157183 Q23.22025

Nonlinear Multi-Error Correction Codes for Reliable MLC nand Flash Memories

用于可靠MLC NAND闪存的非线性多错误校正码

Wang, Zhen; Karpovsky, Mark; Joshi, Ajay

DOI: 10.1109/TVLSI.2011.2157183

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Copyright © IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 中文内容为AI机器翻译,仅供参考!

期刊名:Ieee transactions on very large scale integration (vlsi) systems

缩写:IEEE T VLSI SYST

ISSN:1063-8210

e-ISSN:1557-9999

IF/分区:3.2/Q2

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Nonlinear Multi-Error Correction Codes for Reliable MLC nand Flash Memories