IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2011;19(7):1315-1319. doi: 10.1109/TVLSI.2010.2047954 Q23.22025

Design and Performance Evaluation of Radiation Hardened Latches for Nanoscale CMOS

纳米级CMOS辐射加固锁存器的设计与性能评估

DOI: 10.1109/TVLSI.2010.2047954

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